Relative Lifetime Prediction for CPV Die-Attach Layers.
Author: Silverman, T. J.; Bosco, N.; Kurtz, S.
Source: Proceedings of the 2012 IEEE International Reliability Physics Symposium (IRPS), 15-19 April 2012, Anaheim, California.
Pages/Volumes: pp. 4A.2.1 - 4A.2.8
Publication Year: 2012
Publisher, Place: Piscataway, NJ: Institute of Electrical and Electronics Engineers (IEEE)
Notes: See CP-5200-54332 for preprint.
Document Type: Conference Paper
NTIS/GPO Number: 1055388
Subject Code Description: Solar Energy - Photovoltaics
Accession Number: 56821
Library Notes: NPL-1210 REV
Report Numbers: CP-5200-56821
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