On the Effect of Ramp Rate in Damage Accumulation of the CPV Die-Attach.
Author: Bosco, N. S.; Silverman, T. J.; Kurtz, S. R.
Source: [Proceedings] 38th IEEE Photovoltaic Specialists Conference (PVSC '12), 3-8 June 2012, Austin, Texas.
Pages/Volumes: pp. 001820-001825
Publication Year: 2012
Publisher, Place: Piscataway, NJ: Institute of Electrical and Electronics Engineers (IEEE)
Notes: See CP-5200-54092 for preprint.
Document Type: Conference Paper
NTIS/GPO Number: 1061372
Subject Code Description: Solar Energy - Photovoltaics
Accession Number: 56920
Library Notes: NPL-1210 REV
Report Numbers: CP-5200-56920
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