Return to Document List
Go to Next Document 
Document Summary
Title:
Reliability Testing the Die-Attach of CPV Cell Assemblies.
Author:
Bosco, N.; Sweet, C.; Kurtz, S.
Pages/Volumes:
9 pp.
Publication Year:
2011
Notes:
34th IEEE Photovoltaic Specialists Conference (PVSC '09), 7-12 June 2009, Philadelphia, Pennsylvania
Document Type:
Conference Paper
NTIS/GPO Number:
1007343
Subject Code Description:
Solar Energy - Photovoltaics
Abstract:
Results and progress are reported for a course of work to establish an efficient reliability test for the die-attach of CPV cell assemblies. Test vehicle design consists of a ~1 cm2 multijunction cell attached to a substrate via several processes. A thermal cycling sequence is developed in a test-to-failure protocol. Methods of detecting a failed or failing joint are prerequisite for this work; therefore both in-situ and non-destructive methods, including infrared imaging techniques, are being explored as a method to quickly detect non-ideal or failing bonds.
Accession Number:
46058
Library Notes:
NPL-1102 REV
Report Numbers:
CP-5200-46058
|
PDF: This document is available as an Adobe Acrobat PDF. Download Acrobat Reader. |
