Correlation of Capacitance-Voltage Hysteresis Measurements with Performance During Accelerated Lifetime Testing of Polycrystalline Thin Film Solar Cells.
Author: Albin, D. S.
Source: Proceedings of the 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), 5-9 July 2010, Singapore.
Pages/Volumes: 6 pp.
Publication Year: 2010
Publisher, Place: Piscataway, NJ: Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Document Type: Conference Paper
Subject Code Description: Solar Energy - Photovoltaics
Accession Number: 48441
Library Notes: NPL-1008 REV
Report Numbers: CP-520-48441
||DOI: If your organization has an online subscription to this journal you may be able to view the full document with this link; otherwise, you will be given the option to purchase the document through the publisher.|