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Title: Correlation Between Measured Minority-Carrier Lifetime and Cu(In,Ga)Se2 Device Performance.
Author: Repins, I. L.; Metzger, W. K.; Perkins, C. L.; Li, J. V.; Contreras, M. A.
Source: IEEE Transactions on Electron Devices.
Pages/Volumes: 7 pp.
Publication Year: 2010
Document Type: Journal Article
Subject Code Description: Solar Energy - Photovoltaics
Accession Number: 47305
Library Notes: NPL-1009 REV
Report Numbers: JA-520-47305

DOI Link: http://dx.doi.org/10.1109/TED.2010.2066130
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