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Document Summary

Title: Test-to-Failure of Crystalline Silicon Modules.
Author: Hacke, P.; Terwilliger, K.; Glick, S.; Trudell, D.; Bosco, N.; Johnston, S.; Kurtz, S.
Source: [Proceedings] 35th IEEE Photovoltaic Specialists Conference (PVSC '10), 20-25 June 2010, Honolulu, Hawaii.
Pages/Volumes: pp. 000244-000250
Publication Year: 2010
Publisher, Place: Piscataway, NJ: Institute of Electrical and Electronics Engineers (IEEE)
Document Type: Conference Paper
Subject Code Description: Solar Energy - Photovoltaics
Accession Number: 49953
Library Notes: NPL-1011 REV
Report Numbers: CP-520-49953

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