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Document Summary
Title:
Test-to-Failure of Crystalline Silicon Modules.
Author:
Hacke, P.; Terwilliger, K.; Glick, S.; Trudell, D.; Bosco, N.; Johnston, S.; Kurtz, S.
Source:
[Proceedings] 35th IEEE Photovoltaic Specialists Conference (PVSC '10), 20-25 June 2010, Honolulu, Hawaii.
Pages/Volumes:
pp. 000244-000250
Publication Year:
2010
Publisher, Place:
Piscataway, NJ: Institute of Electrical and Electronics Engineers (IEEE)
Document Type:
Conference Paper
Subject Code Description:
Solar Energy - Photovoltaics
Accession Number:
49953
Library Notes:
NPL-1011 REV
Report Numbers:
CP-520-49953
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DOI Link:
http://dx.doi.org/10.1109/PVSC.2010.5614472
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