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Document Summary
Title:
Relative Lifetime Prediction for CPV Die-Attach Layers.
Author:
Silverman, T. J.; Bosco, N.; Kurtz, S.
Source:
Proceedings of the 2012 IEEE International Reliability Physics Symposium (IRPS), 15-19 April 2012, Anaheim, California.
Pages/Volumes:
pp. 4A.2.1 - 4A.2.8
Publication Year:
2012
Publisher, Place:
Piscataway, NJ: Institute of Electrical and Electronics Engineers (IEEE)
Notes:
See CP-5200-54332 for preprint.
Document Type:
Conference Paper
NTIS/GPO Number:
1055388
Subject Code Description:
Solar Energy - Photovoltaics
Accession Number:
56821
Library Notes:
NPL-1210 REV
Report Numbers:
CP-5200-56821
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DOI Link:
http://dx.doi.org/10.1109/IRPS.2012.6241826
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