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Title: Measurement of Two Deep H Bonding Levels in Device Quality Glow Discharge a-Si:H.
Author: Mahan, A. H.; Johnson, E. J.; Crandall, R. S.; Branz, H. M.
Source: Amorphous Silicon Technology 1995: Proceedings of the Materials Research Society Symposium, 18-21 April 1995, San Francisco, California. Materials Research Society Symposium Proceedings, Vol. 377.
Pages/Volumes: pp. 413-418
Editor: Hack, M., et al., eds.
Publication Year: 1995
Publisher, Place: Pittsburgh, PA: Materials Research Society
Document Type: Conference Paper
Subject Code Description: Silicon Materials and Devices; Materials Science and Semiconductors; Amorphous Silicon
Accession Number: 16538
Library Notes: NPL-9603 REV
Report Numbers: TP-451-7999