Search Results

3.7 MB

1.  Bosco, N.; Silverman, T.; Wohlgemuth , J.; Kurtz, S.; Inoue, M.; Sakurai, K.; Shioda, T.; Zenkoh, H.; Miyashita, M.; Tadanori, T.; Suzuki, S. (2013). Accelerating Fatigue Testing for Cu Ribbon Interconnects (Presentation). NREL (National Renewable Energy Laboratory). 20 pp.; NREL Report No. PR-5200-58369.

2.  Bosco, N. S.; Silverman, T. J.; Kurtz, S. R. (2012). On the Effect of Ramp Rate in Damage Accumulation of the CPV Die-Attach. [Proceedings] 38th IEEE Photovoltaic Specialists Conference (PVSC '12), 3-8 June 2012, Austin, Texas. Piscataway, NJ: Institute of Electrical and Electronics Engineers (IEEE) pp. 001820-001825; NREL Report No. CP-5200-56920. http://dx.doi.org/10.1109/PVSC.2012.6317947

711 KB

3.  Silverman, T. J.; Bosco, N.; Kurtz, S. (2012). Relative Lifetime Prediction for CPV Die-Attach Layers: Preprint. 10 pp.; NREL Report No. CP-5200-54332.

1.3 MB

4.  Bosco, N. (2012). Modeling Metal Fatigue As a Key Step in PV Module Life Time Prediction (Presentation). NREL (National Renewable Energy Laboratory). 23 pp.; NREL Report No. PR-5200-54565.

651 KB

5.  Bosco, N. S.; Silverman, T. J.; Kurtz, S. R. (2012). On the Effect of Ramp Rate in Damage Accumulation of the CPV Die-Attach: Preprint. 8 pp.; NREL Report No. CP-5200-54092.

6.  Bosco, N.; Silverman, T.; Kurtz, S. (2012). Simulation and Experiment of Thermal Fatigue in the CPV Die Attach. Dimroth, F., Rubio, F., and Anton, I., eds. 8th International Conference on Concentrating Photovoltaic Systems: CPV-8, 16-18 April 2012, Toledo, Spain. AIP Conference Proceedings, Volume 1477. Melville, New York: American Institute of Physics (AIP) pp. 267-271; NREL Report No. CP-5200-56971. http://dx.doi.org/10.1063/1.4753883

2.3 MB

7.  Silverman, T. J.; Bosco, N.; Kurtz, S. (2012). Comparison of Accelerated Testing with Modeling to Predict Lifetime of CPV Solder Layers (Presentation). NREL (National Renewable Energy Laboratory). 40 pp.; NREL Report No. PR-5200-54677.

8.  Silverman, T. J.; Bosco, N.; Kurtz, S. (2012). Relative Lifetime Prediction for CPV Die-Attach Layers. Proceedings of the 2012 IEEE International Reliability Physics Symposium (IRPS), 15-19 April 2012, Anaheim, California. Piscataway, NJ: Institute of Electrical and Electronics Engineers (IEEE) pp. 4A.2.1 - 4A.2.8; NREL Report No. CP-5200-56821. http://dx.doi.org/10.1109/IRPS.2012.6241826

483 KB

9.  Bosco, N.; Silverman, T.; Kurtz, S. (2012). Simulation and Experiment of Thermal Fatigue in the CPV Die Attach: Preprint. 7 pp.; NREL Report No. CP-5200-54915.

10.  Bosco, N.; Sweet, C.; Ludowise, M.; Kurtz, S. (2012). Infant Mortality Study of III-V Multijunction Concentrator Cells. IEEE Journal of Photovoltaics. Vol. 2(4), October 2012; pp. 411-416; NREL Report No. JA-5200-53898. http://dx.doi.org/10.1109/JPHOTOV.2012.2199082

420 KB

11.  Bosco, N.; Kurtz, S. (2011). Quantifying the Thermal Fatigue of CPV Modules. 7 pp.; NREL Report No. CP-5200-47128.

523 KB

12.  Kurtz, S.; Wohlgemuth, J.; Hacke, P.; Bosco, N.; Kempe, M.; Smith, R.; Packard, C. E. (2011). Challenge to Move from 'One Size Fits All' to PV Modules the Customer Needs: Preprint. 7 pp.; NREL Report No. CP-5200-52672.

13.  Bosco, N.; Kurtz, S. (2011). Quantifying the Thermal Fatigue of Concentrating Photovoltaic Modules. Advancing Microelectronics. Vol. 38(1), January/February 2011; pp. 6-9; NREL Report No. JA-5200-49875.

14.  Kurtz, S.; Whitfield, K.; TamizhMani, G.; Koehl, M.; Miller, D.; Joyce, J.; Wohlgemuth, J.; Bosco, N.; Kempe, M.; Zgonena, T. (2011). Evaluation of High-Temperature Exposure of Photovoltaic Modules. Progress in Photovoltaics: Research and Applications. Vol. 19(8), December 2011; pp. 954-965; NREL Report No. JA-520-47673. http://dx.doi.org/10.1002/pip.1103

410 KB

15.  Bosco, N.; Sweet, C.; Kurtz, S. (2011). Reliability Testing the Die-Attach of CPV Cell Assemblies. 9 pp.; NREL Report No. CP-5200-46058.

722 KB

16.  Hacke, P.; Osterwald, C.; Trudell, D.; Terwilliger, K.; Bosco, N.; Oelak, E.; Kurtz, S. (2011). Application of the NREL Test-to-Failure Protocol for PV Modules. 11 pp.; NREL Report No. CP-5200-46374.

17.  Bosco, N.; Silverman, T. J.; Kurtz, S. (2011). Modeling Thermal Fatigue in CPV Cell Assemblies. IEEE Journal of Photovoltaics. Vol. 1(2), October 2012; pp. 242-247; NREL Report No. JA-5200-56881. http://dx.doi.org/10.1109/JPHOTOV.2011.2172575

1.2 MB

18.  Bosco, N.; Sweet, C.; Silverman, T.; Kurtz, S. (2011). CPV Cell Infant Mortality Study: Preprint. 6 pp.; NREL Report No. CP-5200-51337.

542 KB

19.  Muller, M.; Deline, C.; Marion, B.; Kurtz, S.; Bosco, N. (2011). Determining Outdoor CPV Cell Temperature: Preprint. 6 pp.; NREL Report No. CP-5200-51338.

1.5 MB

20.  Bosco, N.; Panchagade, D.; Kurtz, S. (2011). Modeling Thermal Fatigue in CPV Cell Assemblies (Presentation). NREL (National Renewable Energy Laboratory). 12 pp.; NREL Report No. PR-5200-51247.

669 KB

21.  Bosco, N.; Silverman, T. J.; Kurtz, S. (2011). Modeling Thermal Fatigue in CPV Cell Assemblies: Preprint. 8 pp.; NREL Report No. CP-5200-50685.

572 KB

22.  Sweet, C.; Bosco, N.; Kurtz, S. (2011). Correlations in Characteristic Data of Concentrator Photovoltaics (Poster). NREL (National Renewable Energy Laboratory). 1 pg.; NREL Report No. PO-5200-51246.

772 KB

23.  Hacke, P.; Terwilliger, K.; Glick, S.; Trudell, D.; Bosco, N.; Johnston, S.; Kurtz, S. R. (2010). Test-to-Failure of Crystalline Silicon Modules: Preprint. 10 pp.; NREL Report No. CP-5200-47755.

24.  Hacke, P.; Terwilliger, K.; Glick, S.; Trudell, D.; Bosco, N.; Johnston, S.; Kurtz, S. (2010). Test-to-Failure of Crystalline Silicon Modules. [Proceedings] 35th IEEE Photovoltaic Specialists Conference (PVSC '10), 20-25 June 2010, Honolulu, Hawaii. Piscataway, NJ: Institute of Electrical and Electronics Engineers (IEEE) pp. 000244-000250; NREL Report No. CP-520-49953. http://dx.doi.org/10.1109/PVSC.2010.5614472

1.2 MB

25.  Bosco, N.; Kurtz, S.; Stokes, A. (2010). Accelerated Testing and On-Sun Failure of CPV Die-Attach (Presentation). 22 pp.; NREL Report No. PR-5200-49243.