Search Results

1.  Goodrich, A.; Hacke, P.; Wang, Q.; Sopori, B.; Margolis, R.; James, T. L.; Woodhouse, M. (2013). Wafer-Based Monocrystalline Silicon Photovoltaics Road Map: Utilizing Known Technology Improvement Opportunities for Further Reductions in Manufacturing Costs. Solar Energy Materials and Solar Cells. Vol. 114, July 2013; pp. 110-135; NREL Report No. JA-6A20-57504. http://dx.doi.org/10.1016/j.solmat.2013.01.030

1.3 MB

2.  Hacke, P.; Terwilliger, K.; Koch, S.; Weber, T.; Berghold, J.; Hoffmann, S.; Ambrosi, H.; Koehl, M.; Dietrich, S.; Ebert, M.; Mathiak, G. (2013). Initial results of IEC 62804 draft round robin testing (Presentation). NREL (National Renewable Energy Laboratory). 12 pp.; NREL Report No. PR-5200-58378.

628 KB

3.  Hacke, P.; Glick, S.; Johnston, S.; Reedy, R.; Pankow, J.; Terwilliger, K.; Kurtz, S. (2012). Influence of Impurities in Module Packaging on Potential-Induced Degradation. 10 pp.; NREL Report No. TP-5200-56301.

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4.  Goodrich, A.; Woodhouse, M.; Hacke, P. (2012). Value Proposition for High Lifetime (p-type) and Thin Silicon Materials in Solar PV Applications: Preprint. 6 pp.; NREL Report No. CP-6A20-55477.

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5.  Hacke, P.; Smith, R.; Terwiliger, K.; Glick, S.; Jordan, D.; Johnston, S.; Kempe, M.; Kurtz, S. (2012). Testing and Analysis for Lifetime Prediction of Crystalline Silicon PV Modules Undergoing Degradation by System Voltage Stress: Preprint. 8 pp.; NREL Report No. CP-5200-54109.

6.  Hacke, P.; Smith, R.; Terwiliger, K.; Glick, S.; Jordan, D.; Johnston, S.; Kempe, M.; Kurtz, S. (2012). Testing and Analysis for Lifetime Prediction of Crystalline Silicon PV Modules Undergoing Degradation by System Voltage Stress. [Proceedings] 38th IEEE Photovoltaic Specialists Conference (PVSC '12), 3-8 June 2012, Austin, Texas. Piscataway, NJ: Institute of Electrical and Electronics Engineers (IEEE) pp. 001750-001755; NREL Report No. CP-5200-56918. http://dx.doi.org/10.1109/PVSC.2012.6317933

7.  Goodrich, A.; Woodhouse, M.; Hacke, P. (2012). Value Proposition for High Lifetime (p-type) and Thin Silicon Materials in Solar PV Applications. [Proceedings] 38th IEEE Photovoltaic Specialists Conference (PVSC '12), 3-8 June 2012, Austin, Texas. Piscataway, NJ: Institute of Electrical and Electronics Engineers (IEEE) pp. 003238-003241; NREL Report No. CP-6A20-56932. http://dx.doi.org/10.1109/PVSC.2012.6318267

879 KB

8.  Hacke, P. (2012). NREL Test-to-Failure Protocol (Presentation). NREL (National Renewable Energy Laboratory). 4 pp.; NREL Report No. PR-5200-54713.

2.6 MB

9.  Hacke, P. (2012). Considerations for a Standardized Test for Potential-Induced Degradation of Crystalline Silicon PV Modules (Presentation). NREL (National Renewable Energy Laboratory). 30 pp.; NREL Report No. PR-5200-54581.

10.  Alers, G. B.; Zhou, J.; Deline, C.; Hacke, P.; Kurtz, S. R. (2011). Degradation of Individual Cells in a Module Measured with Differential IV Analysis. Progress in Photovoltaics: Research and Applications. Vol. 19(8), December 2011; pp. 977-982; NREL Report No. JA-520-47218. http://dx.doi.org/10.1002/pip.1013

757 KB

11.  Hacke, P.; Kempe, M.; Terwilliger, K.; Glick, S.; Call, N.; Johnston, S.; Kurtz, S. (2011). Characterization of Multicrystalline Silicon Modules with System Bias Voltage Applied in Damp Heat. 8 pp.; NREL Report No. CP-5200-49344.

695 KB

12.  Hacke, P.; Terwilliger, K.; Smith, R.; Glick, S.; Pankow, J.; Kempe, M.; Kurtz, S.; Bennett, I.; Kloos, M. (2011). System Voltage Potential-Induced Degradation Mechanisms in PV Modules and Methods for Test: Preprint. 8 pp.; NREL Report No. CP-5200-50716.

637 KB

13.  Hacke, P.; Terwilliger, K.; Glick, S.; Kempe, M.; Kurtz, S.; Bennett, I.; Kloos, M. (2011). Requirements for a Standard Test to Rate the Durability of PV Modules at System Voltage (Presentation). NREL (National Renewable Energy Laboratory). 10 pp.; NREL Report No. PR-5200-51099.

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14.  Kurtz, S.; Hacke, P.; Wohlgemuth, J.; Kempe, M.; Yamamichi, M. (2011). International Quality Assurance Standards (Presentation). NREL (National Renewable Energy Laboratory). 13 pp.; NREL Report No. PR-5200-51123.

15.  Kurtz, S.; Wohlgemuth, J.; Sample, T.; Yamamichi, M.; Amano, J.; Hacke, P.; Kempe, M.; Kondo, M.; Doi, T.; Otani, K. (2011). Ensuring Quality of PV Modules. [Proceedings] 37th IEEE Photovoltaic Specialists Conference (PVSC '11), 19-24 June 2011, Seattle, Washington. Piscataway, NJ: Institute of Electrical and Electronics Engineers, Inc. (IEEE) pp. 000842-000847; NREL Report No. CP-5200-55729. http://dx.doi.org/10.1109/pvsc.2011.6186084

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16.  Kurtz, S.; Wohlgemuth, J.; Hacke, P.; Bosco, N.; Kempe, M.; Smith, R.; Packard, C. E. (2011). Challenge to Move from 'One Size Fits All' to PV Modules the Customer Needs: Preprint. 7 pp.; NREL Report No. CP-5200-52672.

17.  Sample, T.; Kurtz, S.; Wohlgemuth, J.; Yamamichi, M.; Amano, J.; Hacke, P.; Kempe, M.; Kondo, M.; Doi, T.; Otani, K. (2011). Results of the International PV Module Quality Assurance Forum and the Road Ahead. 26th European Photovoltaic Solar Energy Conference: Proceedings of the International Conference, 5-9 September 2011, Hamburg, Germany. Munich, Germany: WIP-Renewable Energies pp. 3661-3664; NREL Report No. CP-5200-54389. http://dx.doi.org/10.4229/26thEUPVSEC2011-4AV.2.60

225 KB

18.  Kurtz, S.; Wohlgemuth, J.; Hacke, P.; Kempe, M.; Sample, T.; Yamamichi, M.; Kondo, M.; Doi, T.; Otani, K.; Amano, J. (2011). Ensuring Quality of PV Modules: Preprint. 8 pp.; NREL Report No. CP-5200-50651.

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19.  Hacke, P.; Osterwald, C.; Trudell, D.; Terwilliger, K.; Bosco, N.; Oelak, E.; Kurtz, S. (2011). Application of the NREL Test-to-Failure Protocol for PV Modules. 11 pp.; NREL Report No. CP-5200-46374.

20.  Hacke, P.; Terwilliger, K.; Smith, R.; Glick, S.; Pankow, J.; Kempe, M.; Kurtz, S.; Bennett, I.; Kloos, M. (2011). System Voltage Potential-Induced Degradation Mechanisms in PV Modules and Methods for Test. [Proceedings] 37th IEEE Photovoltaic Specialists Conference (PVSC '11), 19-24 June 2011, Seattle, Washington. Piscataway, NJ: Institute of Electrical and Electronics Engineers, Inc. (IEEE) pp. 000814-000820; NREL Report No. CP-5200-55714. http://dx.doi.org/10.1109/pvsc.2011.6186079

772 KB

21.  Hacke, P.; Terwilliger, K.; Glick, S.; Trudell, D.; Bosco, N.; Johnston, S.; Kurtz, S. R. (2010). Test-to-Failure of Crystalline Silicon Modules: Preprint. 10 pp.; NREL Report No. CP-5200-47755.

22.  Hacke, P.; Terwilliger, K.; Glick, S.; Trudell, D.; Bosco, N.; Johnston, S.; Kurtz, S. (2010). Test-to-Failure of Crystalline Silicon Modules. [Proceedings] 35th IEEE Photovoltaic Specialists Conference (PVSC '10), 20-25 June 2010, Honolulu, Hawaii. Piscataway, NJ: Institute of Electrical and Electronics Engineers (IEEE) pp. 000244-000250; NREL Report No. CP-520-49953. http://dx.doi.org/10.1109/PVSC.2010.5614472

23.  Hacke, P.; Kempe, M.; Terwilliger, K.; Glick, S.; Call, N.; Johnston, S.; Kurtz, S. (2010). Characterization of Multicrystalline Silicon Modules with System Bias Voltage Applied in Damp Heat. 25th European Photovoltaic Solar Energy Conference: Proceedings of the International Conference, 6-10 September 2010, Valencia, Spain. Munich, Germany: WIP-Renewable Energies pp. 3760-3765; NREL Report No. CP-5200-51764.

1.5 MB

24.  Hacke, P. (2010). Research Opportunities in Reliability of Photovoltaic Modules (Presentation). 17 pp.; NREL Report No. PR-520-49001.

25.  Hacke, P.; Gee, J. M.; Hilali, M.; Dominguez, J.; Dundas, H.; Jain, A.; Lopez, G.; Fischer, B.; Sopori, B. L. (2006). Current Status of Technologies for Industrial Emitter Wrap-Through Solar Cells. Poortmans, J., et al., eds. Twentyfirst European Photovoltaic Solar Energy Conference, 4-8 September 2006, Dresden, Germany. Munich, Germany: WIP-Renewable Energies pp. 761-764; NREL Report No. CP-520-40990.