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Records 1 to 16 of 16


421 KB

1.  Kurtz, S.; Jordan, J.; Kempe, M.; Miller, D.; Bosco, N.; Silverman, T.; Hacke, P.; Phillips, N.; Earnest, T.; Romero, R. (2014). Qualification Plus: Performance and Durability Tests Beyond IEC 61215 (Presentation). NREL (National Renewable Energy Laboratory). 15 pp.; NREL Report No. PR-5200-61518.


3.7 MB

2.  Bosco, N.; Silverman, T.; Wohlgemuth , J.; Kurtz, S.; Inoue, M.; Sakurai, K.; Shioda, T.; Zenkoh, H.; Miyashita, M.; Tadanori, T.; Suzuki, S. (2013). Accelerating Fatigue Testing for Cu Ribbon Interconnects (Presentation). NREL (National Renewable Energy Laboratory). 20 pp.; NREL Report No. PR-5200-58369.


587 KB

3.  Kurtz, S.; Wohlgemuth, J.; Kempe, M.; Bosco, N.; Hacke, P.; Jordan, D.; Miller, D. C.; Silverman, T. J.; Phillips, N.; Earnest, T.; Romero, R. (2013). Photovoltaic Module Qualification Plus Testing. 30 pp.; NREL Report No. TP-5200-60950.


2.9 MB

4.  Silverman, T. J.; Deceglie, M. G.; Marion, B.; Cowley, S.; Kayes, B.; Kurtz, S. (2013). Outdoor Performance of a Thin-Film Gallium-Arsenide Photovoltaic Module. 6 pp.; NREL Report No. CP-5200-57902.


711 KB

5.  Silverman, T. J.; Bosco, N.; Kurtz, S. (2012). Relative Lifetime Prediction for CPV Die-Attach Layers: Preprint. 10 pp.; NREL Report No. CP-5200-54332.


2.3 MB

6.  Silverman, T. J.; Bosco, N.; Kurtz, S. (2012). Comparison of Accelerated Testing with Modeling to Predict Lifetime of CPV Solder Layers (Presentation). NREL (National Renewable Energy Laboratory). 40 pp.; NREL Report No. PR-5200-54677.


483 KB

7.  Bosco, N.; Silverman, T.; Kurtz, S. (2012). Simulation and Experiment of Thermal Fatigue in the CPV Die Attach: Preprint. 7 pp.; NREL Report No. CP-5200-54915.


651 KB

8.  Bosco, N. S.; Silverman, T. J.; Kurtz, S. R. (2012). On the Effect of Ramp Rate in Damage Accumulation of the CPV Die-Attach: Preprint. 8 pp.; NREL Report No. CP-5200-54092.

9.  Silverman, T. J.; Bosco, N.; Kurtz, S. (2012). Relative Lifetime Prediction for CPV Die-Attach Layers. Proceedings of the 2012 IEEE International Reliability Physics Symposium (IRPS), 15-19 April 2012, Anaheim, California. Piscataway, NJ: Institute of Electrical and Electronics Engineers (IEEE) pp. 4A.2.1 - 4A.2.8; NREL Report No. CP-5200-56821. http://dx.doi.org/10.1109/IRPS.2012.6241826

10.  Bosco, N. S.; Silverman, T. J.; Kurtz, S. R. (2012). On the Effect of Ramp Rate in Damage Accumulation of the CPV Die-Attach. [Proceedings] 38th IEEE Photovoltaic Specialists Conference (PVSC '12), 3-8 June 2012, Austin, Texas. Piscataway, NJ: Institute of Electrical and Electronics Engineers (IEEE) pp. 001820-001825; NREL Report No. CP-5200-56920. http://dx.doi.org/10.1109/PVSC.2012.6317947

11.  Bosco, N.; Silverman, T.; Kurtz, S. (2012). Simulation and Experiment of Thermal Fatigue in the CPV Die Attach. Dimroth, F., Rubio, F., and Anton, I., eds. 8th International Conference on Concentrating Photovoltaic Systems: CPV-8, 16-18 April 2012, Toledo, Spain. AIP Conference Proceedings, Volume 1477. Melville, New York: American Institute of Physics (AIP) pp. 267-271; NREL Report No. CP-5200-56971. http://dx.doi.org/10.1063/1.4753883


900 KB

12.  Deline, C.; Stokes, A.; Silverman, T. J.; Rummel, S.; Jordan, D.; Kurtz, S. (2012). Electrical Bias as an Alternate Method for Reproducible Measurement of Copper Indium Gallium Diselenide (CIGS) Photovoltaic Modules: Preprint. 14 pp.; NREL Report No. CP-5200-56078.

13.  Deline, C.; Stokes, A.; Silverman, T. J.; Rummel, S.; Jordan, D.; Kurtz, S. (2012). Electrical Bias as an Alternate Method for Reproducible Measurement of Copper Indium Gallium Diselenide (CIGS) Photovoltaic Modules. Paper No. 84720G. Dhere, N. G., ed. Reliability of Photovoltaic Cells, Modules, Components, and Systems V: Proceedings of SPIE Conference, 12-16 August 2012, San Diego, California. Proceedings of SPIE - The International Society for Optical Engineering, Volume 8472. Bellingham, WA: SPIE - The International Society for Optical Engineering http://dx.doi.org/10.1117/12.929899

14.  Bosco, N.; Silverman, T. J.; Kurtz, S. (2011). Modeling Thermal Fatigue in CPV Cell Assemblies. IEEE Journal of Photovoltaics. Vol. 1(2), October 2012; pp. 242-247; NREL Report No. JA-5200-56881. http://dx.doi.org/10.1109/JPHOTOV.2011.2172575


1.2 MB

15.  Bosco, N.; Sweet, C.; Silverman, T.; Kurtz, S. (2011). CPV Cell Infant Mortality Study: Preprint. 6 pp.; NREL Report No. CP-5200-51337.


669 KB

16.  Bosco, N.; Silverman, T. J.; Kurtz, S. (2011). Modeling Thermal Fatigue in CPV Cell Assemblies: Preprint. 8 pp.; NREL Report No. CP-5200-50685.



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