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Records 1 to 25 of 63

1.  Hacke, P.; Terwilliger, K.; Glick, S.; Tamizhmani, G.; Tatapudi, S.; Stark, C.; Koch, S.; Weber, T.; Berghold, J.; Hoffmann, S.; Koehl, M.; Dietrich, S.; Ebert, M.; Mathiak, G. (2015). Interlaboratory Study to Determine Repeatability of the Damp-Heat Test Method for Potential-Induced Degradation and Polarization in Crystalline Silicon Photovoltaic Modules. IEEE Journal of Photovoltaics. Vol. 5(1), January 2015; pp. 94-101; NREL Report No. JA-5J00-62229. http://dx.doi.org/10.1109/JPHOTOV.2014.2361650

2.  Hacke, P.; Terwilliger, K.; Glick, S.; Smith, R.; Perrin, G.; Kurtz, S.; Bosco, N.; Wohlgemuth, J. (2014). Application of the Terrestrial Photovoltaic Module Accelerated Test-to-Failure Protocol. Proceedings of the 2014 IEEE 40th Photovoltaic Specialist Conference (PVSC), 8-13 June 2014, Denver, Colorado. Piscataway, NJ: Institute of Electrical and Electronics Engineers (IEEE) pp. 930-936; NREL Report No. CP-5J00-62060. http://dx.doi.org/10.1109/PVSC.2014.6925066


1.6 MB

3.  Marion, W.; Anderberg, A.; Deline, C.; Glick, S.; Muller, M.; Perrin, G.; Rodriguez, J.; Rummel, S.; Terwilliger, K.; Silverman, T. J. (2014). User's Manual for Data for Validating Models for PV Module Performance. 49 pp.; NREL Report No. TP-5200-61610.

4.  Hacke, P.; Smith, R.; Terwilliger, K.; Glick, S.; Jordan, D.; Johnston, S.; Kempe, M.; Kurtz, S. (2013). Acceleration Factor Determination for Potential-Induced Degradation in Crystalline Silicon PV Modules. Proceedings of the 2013 IEEE International Reliability Physics Symposium (IRPS), 14-18 April 2013, Anaheim, California. Piscataway, NJ: Institute of Electrical and Electronics Engineers (IEEE) pp. 4B.1.1-4B.1.5; NREL Report No. CP-5200-58058. http://dx.doi.org/10.1109/IRPS.2013.6532009

5.  Mann, J. R.; Kempe, M.; Repins, I.; Duda, A.; Glick, S.; Kanevce, A. (2013). Dry Heat-Induced Effect of Using Silver in CIGS Gridlines. IEEE Journal of Photovoltaics. Vol. 3(1), January 2013; pp. 457-460; NREL Report No. JA-5200-56300. http://dx.doi.org/10.1109/JPHOTOV.2012.2219852

6.  Hacke, P.; Smith, R.; Terwilliger, K.; Glick, S.; Jordan, D.; Johnston, S.; Kempe, M.; Kurtz, S. (2013). Testing and Analysis for Lifetime Prediction of Crystalline Silicon PV Modules Undergoing Degradation by System Voltage Stress. IEEE Journal of Photovoltaics. Vol. 3(1), January 2013; pp. 246-253; NREL Report No. JA-5200-59072. http://dx.doi.org/10.1109/JPHOTOV.2012.2222351


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7.  Hacke, P.; Smith, R.; Terwiliger, K.; Glick, S.; Jordan, D.; Johnston, S.; Kempe, M.; Kurtz, S. (2012). Testing and Analysis for Lifetime Prediction of Crystalline Silicon PV Modules Undergoing Degradation by System Voltage Stress: Preprint. 8 pp.; NREL Report No. CP-5200-54109.

8.  Hacke, P.; Smith, R.; Terwiliger, K.; Glick, S.; Jordan, D.; Johnston, S.; Kempe, M.; Kurtz, S. (2012). Testing and Analysis for Lifetime Prediction of Crystalline Silicon PV Modules Undergoing Degradation by System Voltage Stress. [Proceedings] 38th IEEE Photovoltaic Specialists Conference (PVSC '12), 3-8 June 2012, Austin, Texas. Piscataway, NJ: Institute of Electrical and Electronics Engineers (IEEE) pp. 001750-001755; NREL Report No. CP-5200-56918. http://dx.doi.org/10.1109/PVSC.2012.6317933


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9.  Hacke, P.; Glick, S.; Johnston, S.; Reedy, R.; Pankow, J.; Terwilliger, K.; Kurtz, S. (2012). Influence of Impurities in Module Packaging on Potential-Induced Degradation. 10 pp.; NREL Report No. TP-5200-56301.


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10.  Hacke, P.; Kempe, M.; Terwilliger, K.; Glick, S.; Call, N.; Johnston, S.; Kurtz, S. (2011). Characterization of Multicrystalline Silicon Modules with System Bias Voltage Applied in Damp Heat. 8 pp.; NREL Report No. CP-5200-49344.

11.  Pern, F. J.; Mansfield, L.; DeHart, C.; Glick, S. H.; Yan, F.; Noufi, R. (2011). Thickness Effect of Al-Doped ZnO Window Layer on Damp-Heat Stability of CuInGaSe2 Solar Cells. [Proceedings] 37th IEEE Photovoltaic Specialists Conference (PVSC '11), 19-24 June 2011, Seattle, Washington. Piscataway, NJ: Institute of Electrical and Electronics Engineers, Inc. (IEEE) pp. 002798-002803; NREL Report No. CP-5200-55751. http://dx.doi.org/10.1109/pvsc.2011.6186527


516 KB

12.  Pern, F. J.; Mansfield, L.; DeHart, C.; Glick, S. H.; Yan, F.; Noufi, R. (2011). Thickness Effect of Al-Doped ZnO Window Layer on Damp Heat Stability of CuInGaSe2 Solar Cells: Preprint. 8 pp.; NREL Report No. CP-5200-50682.


1.1 MB

13.  Miller, D. C.; Kempe, M. D.; Glick, S. H.; Kurtz, S. R. (2011). Creep in Photovoltaic Modules: Examining the Stability of Polymeric Materials and Components. 9 pp.; NREL Report No. CP-5200-47718.

14.  Hacke, P.; Terwilliger, K.; Smith, R.; Glick, S.; Pankow, J.; Kempe, M.; Kurtz, S.; Bennett, I.; Kloos, M. (2011). System Voltage Potential-Induced Degradation Mechanisms in PV Modules and Methods for Test. [Proceedings] 37th IEEE Photovoltaic Specialists Conference (PVSC '11), 19-24 June 2011, Seattle, Washington. Piscataway, NJ: Institute of Electrical and Electronics Engineers, Inc. (IEEE) pp. 000814-000820; NREL Report No. CP-5200-55714. http://dx.doi.org/10.1109/pvsc.2011.6186079


637 KB

15.  Hacke, P.; Terwilliger, K.; Glick, S.; Kempe, M.; Kurtz, S.; Bennett, I.; Kloos, M. (2011). Requirements for a Standard Test to Rate the Durability of PV Modules at System Voltage (Presentation). NREL (National Renewable Energy Laboratory). 10 pp.; NREL Report No. PR-5200-51099.


695 KB

16.  Hacke, P.; Terwilliger, K.; Smith, R.; Glick, S.; Pankow, J.; Kempe, M.; Kurtz, S.; Bennett, I.; Kloos, M. (2011). System Voltage Potential-Induced Degradation Mechanisms in PV Modules and Methods for Test: Preprint. 8 pp.; NREL Report No. CP-5200-50716.

17.  Pern, F. J.; Glick, S. H.; Sundaramoorthy, R.; To, B.; Li, X.; DeHart, C.; Glynn, S.; Gennett, T.; Noufi, R.; Gessert, T. (2010). Damp-Heat Instability and Mitigation of ZnO-Based Thin Films for CuInGaSe2 Solar Cells. [Proceedings] 35th IEEE Photovoltaic Specialists Conference (PVSC '10), 20-25 June 2010, Honolulu, Hawaii. Piscataway, NJ: Institute of Electrical and Electronics Engineers (IEEE) pp. 001166-001171; NREL Report No. CP-520-47725. http://dx.doi.org/10.1109/PVSC.2010.5614116

18.  Hacke, P.; Kempe, M.; Terwilliger, K.; Glick, S.; Call, N.; Johnston, S.; Kurtz, S. (2010). Characterization of Multicrystalline Silicon Modules with System Bias Voltage Applied in Damp Heat. 25th European Photovoltaic Solar Energy Conference: Proceedings of the International Conference, 6-10 September 2010, Valencia, Spain. Munich, Germany: WIP-Renewable Energies pp. 3760-3765; NREL Report No. CP-5200-51764.

19.  Pern, F. J.; To, B.; Glick, S. H.; Sundaramoorthy, R.; DeHart, C.; Glynn, S.; Perkins, C.; Mansfield, L.; Gessert, T. (2010). Variations in Damp Heat-Induced Degradation Behavior of Sputtered ZnO Window Layer for CIGS Solar Cells. Paper No. 77730R. Dhere, N. G., Wohlgemuth, J. H., Lynn, K., eds. Reliability of Photovoltaic Cells, Modules, Components, and Systems III: Proceedings of SPIE Conference, 3-5 August 2010, San Diego, California. Proceedings of SPIE - The International Society for Optical Engineering, Volume 7773. Bellingham, WA: SPIE - The International Society for Optical Engineering 12 pp.; NREL Report No. CP-520-48902. http://dx.doi.org/10.1117/12.863078

20.  Hacke, P.; Terwilliger, K.; Glick, S.; Trudell, D.; Bosco, N.; Johnston, S.; Kurtz, S. (2010). Test-to-Failure of Crystalline Silicon Modules. [Proceedings] 35th IEEE Photovoltaic Specialists Conference (PVSC '10), 20-25 June 2010, Honolulu, Hawaii. Piscataway, NJ: Institute of Electrical and Electronics Engineers (IEEE) pp. 000244-000250; NREL Report No. CP-520-49953. http://dx.doi.org/10.1109/PVSC.2010.5614472

21.  Miller, D. C.; Kempe, M. D.; Glick, S. H.; Kurtz, S. R. (2010). Creep in Photovoltaic Modules: Examining the Stability of Polymeric Materials and Components. [Proceedings] 35th IEEE Photovoltaic Specialists Conference (PVSC '10), 20-25 June 2010, Honolulu, Hawaii. Piscataway, NJ: Institute of Electrical and Electronics Engineers (IEEE) pp. 000262-000268; NREL Report No. CP-520-50802. http://dx.doi.org/10.1109/PVSC.2010.5615832


772 KB

22.  Hacke, P.; Terwilliger, K.; Glick, S.; Trudell, D.; Bosco, N.; Johnston, S.; Kurtz, S. R. (2010). Test-to-Failure of Crystalline Silicon Modules: Preprint. 10 pp.; NREL Report No. CP-5200-47755.

23.  Pern, F. J.; Glick, S. H.; Li, X.; DeHart, C.; Gennet, T.; Contreras, M.; Gessert, T. (2009). Stability of TCO Window Layers for Thin-Film CIGS Solar Cells Upon Damp Heat Exposures - Part III. Paper No. 74120K. Dhere, N. G., ed. Reliability of Photovoltaic Cells, Modules, Components, and Systems II: Proceedings of SPIE Conference, 3-6 August 2009, San Diego, California. Proceedings of SPIE - The International Society for Optical Engineering, Volume 7412. Bellingham, WA: SPIE - The International Society for Optical Engineering 12 pp.; NREL Report No. CP-520-44956. http://dx.doi.org/10.1117/12.826559


1.3 MB

24.  Pern, F.J.; To, B.; DeHart, C.; Li, X.; Glick, S. H.; Noufi, R. (2008). Degradation of ZnO Window Layer for CIGS by Damp-Heat Exposure: Preprint. 17 pp.; NREL Report No. CP-520-42792.

25.  Pern, F. J.; Noufi, R.; To, B.; DeHart, C.; Li, X.; Glick, S. H. (2008). Degradation of ZnO-Based Window Layers for Thin-Film CIGS by Accelerated Stress Exposures. Paper No. 70480P. Dhere, N. G., ed. Reliability of Photovoltaic Cells, Modules, Components, and Systems: Proceedings of SPIE Conference, 11-13 August 2008, San Diego, California. Proceedings of SPIE - The International Society for Optical Engineering, Volume 7048. Bellingham, WA: SPIE - The International Society for Optical Engineering 14 pp.; NREL Report No. CP-520-44859. http://dx.doi.org/10.1117/12.795097



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