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Records 1 to 25 of 36


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1.  Kurtz, S.; Jordan, J.; Kempe, M.; Miller, D.; Bosco, N.; Silverman, T.; Hacke, P.; Phillips, N.; Earnest, T.; Romero, R. (2014). Qualification Plus: Performance and Durability Tests Beyond IEC 61215 (Presentation). NREL (National Renewable Energy Laboratory). 15 pp.; NREL Report No. PR-5200-61518.


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2.  Hacke, P. (2014). Testing Modules for Potential-Induced Degradation - A Status Update of IEC 62804 (Presentation). NREL (National Renewable Energy Laboratory). 27 pp.; NREL Report No. PR-5200-61517.


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3.  Kurtz, S.; Wohlgemuth, J.; Yamamichi, M.; Sample, T.; Miller, D.; Meakin, D.; Monokroussos, C.; TamizhMani, M.; Kempe, M.; Jordan, D.; Bosco, N.; Hacke, P.; Bermudez, V.; Kondo, M. (2013). Framework for a Comparative Accelerated Testing Standard for PV Modules: Preprint. 8 pp.; NREL Report No. CP-5200-57838.


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4.  Kurtz, S.; Wohlgemuth, J.; Kempe, M.; Bosco, N.; Hacke, P.; Jordan, D.; Miller, D. (2013). Proposals for 'Qualification Plus' Tests and Comparative Rating System (Presentation). NREL (National Renewable Energy Laboratory). 34 pp.; NREL Report No. PR-5200-60718.

5.  Hacke, P.; Smith, R.; Terwilliger, K.; Glick, S.; Jordan, D.; Johnston, S.; Kempe, M.; Kurtz, S. (2013). Acceleration Factor Determination for Potential-Induced Degradation in Crystalline Silicon PV Modules. Proceedings of the 2013 IEEE International Reliability Physics Symposium (IRPS), 14-18 April 2013, Anaheim, California. Piscataway, NJ: Institute of Electrical and Electronics Engineers (IEEE) pp. 4B.1.1-4B.1.5; NREL Report No. CP-5200-58058. http://dx.doi.org/10.1109/IRPS.2013.6532009

6.  Goodrich, A.; Hacke, P.; Wang, Q.; Sopori, B.; Margolis, R.; James, T. L.; Woodhouse, M. (2013). Wafer-Based Monocrystalline Silicon Photovoltaics Road Map: Utilizing Known Technology Improvement Opportunities for Further Reductions in Manufacturing Costs. Solar Energy Materials and Solar Cells. Vol. 114, July 2013; pp. 110-135; NREL Report No. JA-6A20-57504. http://dx.doi.org/10.1016/j.solmat.2013.01.030


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7.  Kurtz, S.; Wohlgemuth, J.; Kempe, M.; Bosco, N.; Hacke, P.; Jordan, D.; Miller, D. (2013). Defining a Technical Basis for Confidence in PV Investments - A Pathway to Service Life Prediction (Presentation). NREL (National Renewable Energy Laboratory). 42 pp.; NREL Report No. PR-5200-60554.


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8.  Hacke, P.; Terwilliger, K.; Koch, S.; Weber, T.; Berghold, J.; Hoffmann, S.; Koehl, M.; Dietrich, S.; Ebert, M.; Mathiak, G. (2013). Results of IEC 62804 Draft Round Robin Testing (Presentation). NREL (National Renewable Energy Laboratory). 14 pp.; NREL Report No. PR-5200-60493.


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9.  Kurtz, S.; Wohlgemuth, J.; Kempe, M.; Bosco, N.; Hacke, P.; Jordan, D.; Miller, D. C.; Silverman, T. J.; Phillips, N.; Earnest, T.; Romero, R. (2013). Photovoltaic Module Qualification Plus Testing. 30 pp.; NREL Report No. TP-5200-60950.


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10.  Hacke, P.; Terwilliger, K.; Koch, S.; Weber, T.; Berghold, J.; Hoffmann, S.; Ambrosi, H.; Koehl, M.; Dietrich, S.; Ebert, M.; Mathiak, G. (2013). Initial Results of IEC 62804 Draft Round Robin Testing (Presentation). NREL (National Renewable Energy Laboratory). 12 pp.; NREL Report No. PR-5200-58378.


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11.  Hacke, P.; Terwilliger, K.; Kurtz, S. (2013). In-Situ Measurement of Crystalline Silicon Modules Undergoing Potential-Induced Degradation in Damp Heat Stress Testing for Estimation of Low-Light Power Performance. 10 pp.; NREL Report No. TP-5200-60044.

12.  Hacke, P.; Smith, R.; Terwilliger, K.; Glick, S.; Jordan, D.; Johnston, S.; Kempe, M.; Kurtz, S. (2013). Testing and Analysis for Lifetime Prediction of Crystalline Silicon PV Modules Undergoing Degradation by System Voltage Stress. IEEE Journal of Phtovoltaics. Vol. 3(1), January 2013; pp. 246-253; NREL Report No. JA-5200-59072. http://dx.doi.org/10.1109/JPHOTOV.2012.2222351


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13.  Hacke, P. (2012). Considerations for a Standardized Test for Potential-Induced Degradation of Crystalline Silicon PV Modules (Presentation). NREL (National Renewable Energy Laboratory). 30 pp.; NREL Report No. PR-5200-54581.


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14.  Goodrich, A.; Woodhouse, M.; Hacke, P. (2012). Value Proposition for High Lifetime (p-type) and Thin Silicon Materials in Solar PV Applications: Preprint. 6 pp.; NREL Report No. CP-6A20-55477.

15.  Goodrich, A.; Woodhouse, M.; Hacke, P. (2012). Value Proposition for High Lifetime (p-type) and Thin Silicon Materials in Solar PV Applications. [Proceedings] 38th IEEE Photovoltaic Specialists Conference (PVSC '12), 3-8 June 2012, Austin, Texas. Piscataway, NJ: Institute of Electrical and Electronics Engineers (IEEE) pp. 003238-003241; NREL Report No. CP-6A20-56932. http://dx.doi.org/10.1109/PVSC.2012.6318267


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16.  Hacke, P.; Glick, S.; Johnston, S.; Reedy, R.; Pankow, J.; Terwilliger, K.; Kurtz, S. (2012). Influence of Impurities in Module Packaging on Potential-Induced Degradation. 10 pp.; NREL Report No. TP-5200-56301.


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17.  Hacke, P.; Smith, R.; Terwiliger, K.; Glick, S.; Jordan, D.; Johnston, S.; Kempe, M.; Kurtz, S. (2012). Testing and Analysis for Lifetime Prediction of Crystalline Silicon PV Modules Undergoing Degradation by System Voltage Stress: Preprint. 8 pp.; NREL Report No. CP-5200-54109.


879 KB

18.  Hacke, P. (2012). NREL Test-to-Failure Protocol (Presentation). NREL (National Renewable Energy Laboratory). 4 pp.; NREL Report No. PR-5200-54713.

19.  Hacke, P.; Smith, R.; Terwiliger, K.; Glick, S.; Jordan, D.; Johnston, S.; Kempe, M.; Kurtz, S. (2012). Testing and Analysis for Lifetime Prediction of Crystalline Silicon PV Modules Undergoing Degradation by System Voltage Stress. [Proceedings] 38th IEEE Photovoltaic Specialists Conference (PVSC '12), 3-8 June 2012, Austin, Texas. Piscataway, NJ: Institute of Electrical and Electronics Engineers (IEEE) pp. 001750-001755; NREL Report No. CP-5200-56918. http://dx.doi.org/10.1109/PVSC.2012.6317933


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20.  Kurtz, S.; Hacke, P.; Wohlgemuth, J.; Kempe, M.; Yamamichi, M. (2011). International Quality Assurance Standards (Presentation). NREL (National Renewable Energy Laboratory). 13 pp.; NREL Report No. PR-5200-51123.

21.  Hacke, P.; Terwilliger, K.; Smith, R.; Glick, S.; Pankow, J.; Kempe, M.; Kurtz, S.; Bennett, I.; Kloos, M. (2011). System Voltage Potential-Induced Degradation Mechanisms in PV Modules and Methods for Test. [Proceedings] 37th IEEE Photovoltaic Specialists Conference (PVSC '11), 19-24 June 2011, Seattle, Washington. Piscataway, NJ: Institute of Electrical and Electronics Engineers, Inc. (IEEE) pp. 000814-000820; NREL Report No. CP-5200-55714. http://dx.doi.org/10.1109/pvsc.2011.6186079

22.  Alers, G. B.; Zhou, J.; Deline, C.; Hacke, P.; Kurtz, S. R. (2011). Degradation of Individual Cells in a Module Measured with Differential IV Analysis. Progress in Photovoltaics: Research and Applications. Vol. 19(8), December 2011; pp. 977-982; NREL Report No. JA-520-47218. http://dx.doi.org/10.1002/pip.1013


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23.  Hacke, P.; Osterwald, C.; Trudell, D.; Terwilliger, K.; Bosco, N.; Oelak, E.; Kurtz, S. (2011). Application of the NREL Test-to-Failure Protocol for PV Modules. 11 pp.; NREL Report No. CP-5200-46374.


225 KB

24.  Kurtz, S.; Wohlgemuth, J.; Hacke, P.; Kempe, M.; Sample, T.; Yamamichi, M.; Kondo, M.; Doi, T.; Otani, K.; Amano, J. (2011). Ensuring Quality of PV Modules: Preprint. 8 pp.; NREL Report No. CP-5200-50651.

25.  Sample, T.; Kurtz, S.; Wohlgemuth, J.; Yamamichi, M.; Amano, J.; Hacke, P.; Kempe, M.; Kondo, M.; Doi, T.; Otani, K. (2011). Results of the International PV Module Quality Assurance Forum and the Road Ahead. 26th European Photovoltaic Solar Energy Conference: Proceedings of the International Conference, 5-9 September 2011, Hamburg, Germany. Munich, Germany: WIP-Renewable Energies pp. 3661-3664; NREL Report No. CP-5200-54389. http://dx.doi.org/10.4229/26thEUPVSEC2011-4AV.2.60



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