Skip header navigation to main content. NREL - National Renewable Energy Laboratory
NREL Publications

Return to Search

List Next Documents

Search Results

Some of the following documents are available as Adobe Acrobat PDFs. Download Adobe Reader. Click anywhere on the document title to see a document summary or click on the PDF icon to see full text. To export these results, use the export buttons below. To change the sort results, return to Search NREL Publications.

Records 1 to 25 of 89


466 KB

1.  Kempe, M. (2014). Using Uncertainty Analysis to Guide the Development of Accelerated Stress Tests (Presentation). NREL (National Renewable Energy Laboratory). 19 pp.; NREL Report No. PR-5200-61539.


421 KB

2.  Kurtz, S.; Jordan, J.; Kempe, M.; Miller, D.; Bosco, N.; Silverman, T.; Hacke, P.; Phillips, N.; Earnest, T.; Romero, R. (2014). Qualification Plus: Performance and Durability Tests Beyond IEC 61215 (Presentation). NREL (National Renewable Energy Laboratory). 15 pp.; NREL Report No. PR-5200-61518.


759 KB

3.  Kempe, M. (2013). Understanding the Temperature and Humidity Environment Inside a PV Module (Presentation). NREL (National Renewable Energy Laboratory).

4.  Kempe, M. D.; Wohlgemuth, J. H. (2013). Evaluation of Temperature and Humidity on PV Module Component Degradation. 2013 IEEE 39th Photovoltaic Specialists Conference (PVSC), 16-21 June 2013, Tampa, Florida. Piscataway, NJ: Institute of Electrical and Electronics Engineers (IEEE) pp. 0120-0125; NREL Report No. CP-5200-57859. http://dx.doi.org/10.1109/PVSC.2013.6744112


2.1 MB

5.  Kurtz, S.; Wohlgemuth, J.; Kempe, M.; Bosco, N.; Hacke, P.; Jordan, D.; Miller, D. (2013). Proposals for 'Qualification Plus' Tests and Comparative Rating System (Presentation). NREL (National Renewable Energy Laboratory). 34 pp.; NREL Report No. PR-5200-60718.

6.  Miller, D. C.; Muller, M. T.; Kempe, M. D.; Araki, K.; Kennedy, C. E.; Kurtz, S. R. (2013). Durability of Polymeric Encapsulation Materials for Concentrating Photovoltaic Systems. Progress in Photovoltaics: Research and Applications. Vol. 21(4), June 2013; pp. 631-651; NREL Report No. JA-5200-52177. http://dx.doi.org/10.1002/pip.1241


8.8 MB

7.  Jordan, D.; Kempe, M.; Miller, D.; Packard, C.; Wohlgemuth, J.; Kurtz, S. (2013). Observed Field Failures and Reported Degradation Rates (Presentation). NREL (National Renewable Energy Laboratory). 29 pp.; NREL Report No. PR-5200-59296.

8.  Hacke, P.; Smith, R.; Terwilliger, K.; Glick, S.; Jordan, D.; Johnston, S.; Kempe, M.; Kurtz, S. (2013). Acceleration Factor Determination for Potential-Induced Degradation in Crystalline Silicon PV Modules. Proceedings of the 2013 IEEE International Reliability Physics Symposium (IRPS), 14-18 April 2013, Anaheim, California. Piscataway, NJ: Institute of Electrical and Electronics Engineers (IEEE) pp. 4B.1.1-4B.1.5; NREL Report No. CP-5200-58058. http://dx.doi.org/10.1109/IRPS.2013.6532009

9.  Hacke, P.; Smith, R.; Terwilliger, K.; Glick, S.; Jordan, D.; Johnston, S.; Kempe, M.; Kurtz, S. (2013). Testing and Analysis for Lifetime Prediction of Crystalline Silicon PV Modules Undergoing Degradation by System Voltage Stress. IEEE Journal of Phtovoltaics. Vol. 3(1), January 2013; pp. 246-253; NREL Report No. JA-5200-59072. http://dx.doi.org/10.1109/JPHOTOV.2012.2222351

10.  Mann, J. R.; Kempe, M.; Repins, I.; Duda, A.; Glick, S.; Kanevce, A. (2013). Dry Heat-Induced Effect of Using Silver in CIGS Gridlines. IEEE Journal of Photovoltaics. Vol. 3(1), January 2013; pp. 457-460; NREL Report No. JA-5200-56300. http://dx.doi.org/10.1109/JPHOTOV.2012.2219852


587 KB

11.  Kurtz, S.; Wohlgemuth, J.; Kempe, M.; Bosco, N.; Hacke, P.; Jordan, D.; Miller, D. C.; Silverman, T. J.; Phillips, N.; Earnest, T.; Romero, R. (2013). Photovoltaic Module Qualification Plus Testing. 30 pp.; NREL Report No. TP-5200-60950.

12.  Peike, C.; Purschke, L.; Weiss, K. A.; Kohl, M.; Kempe, M. (2013). Towards the Origin of Photochemical EVA Discoloration. 2013 IEEE 39th Photovoltaic Specialists Conference (PVSC), 16-21 June 2013, Tampa, Florida. Piscataway, NJ: Institute of Electrical and Electronics Engineers (IEEE) pp. 1579-1584; NREL Report No. CP-5200-61949. http://dx.doi.org/10.1109/PVSC.2013.6744447

13.  Wohlgemuth, J. H.; Kempe, M. D. (2013). Equating Damp Heat Testing with Field Failures of PV Modules. 2013 IEEE 39th Photovoltaic Specialists Conference (PVSC), 16-21 June 2013, Tampa, Florida. Piscataway, NJ: Institute of Electrical and Electronics Engineers (IEEE) pp. 0126-0131; NREL Report No. CP-5200-57920. http://dx.doi.org/10.1109/PVSC.2013.6744113


2.6 MB

14.  Kurtz, S.; Wohlgemuth, J.; Kempe, M.; Bosco, N.; Hacke, P.; Jordan, D.; Miller, D. (2013). Defining a Technical Basis for Confidence in PV Investments - A Pathway to Service Life Prediction (Presentation). NREL (National Renewable Energy Laboratory). 42 pp.; NREL Report No. PR-5200-60554.

15.  Wohlgemuth, J. H.; Kempe, M. D.; Miller, D. C. (2013). Discoloration of PV Encapsulants. 2013 IEEE 39th Photovoltaic Specialists Conference (PVSC), 16-21 June 2013, Tampa, Florida. Piscataway, NJ: Institute of Electrical and Electronics Engineers (IEEE) pp. 3260-3265; NREL Report No. CP-5200-57904. http://dx.doi.org/10.1109/PVSC.2013.6745147

16.  Kempe, M. D.; Reese, M. O.; Dameron, A. A. (2013). Evaluation of the Sensitivity Limits of Water Vapor Transmission Rate Measurements Using Electrical Calcium Test. Article No. 025109. Review of Scientific Instruments. Vol. 84(2), February 2013; 10 pp.; NREL Report No. JA-5200-56985. http://dx.doi.org/10.1063/1.4789803

17.  Kurtz, S.; Wohlgemuth, J.; Yamamichi, M.; Sample, T.; Miller, D.; Meakin, D.; Monokroussos, C.; TamizhMani, M.; Kempe, M.; Jordan, D.; Bosco, N.; Hacke, P.; Bermudez, V.; Kondo, M. (2013). Framework for a Comparative Accelerated Testing Standard for PV Modules. 2013 IEEE 39th Photovoltaic Specialists Conference (PVSC), 16-21 June 2013, Tampa, Florida. Piscataway, NJ: Institute of Electrical and Electronics Engineers (IEEE) pp. 0132-0138; NREL Report No. CP-5200-61941. http://dx.doi.org/10.1109/PVSC.2013.6744114


529 KB

18.  Kurtz, S.; Wohlgemuth, J.; Yamamichi, M.; Sample, T.; Miller, D.; Meakin, D.; Monokroussos, C.; TamizhMani, M.; Kempe, M.; Jordan, D.; Bosco, N.; Hacke, P.; Bermudez, V.; Kondo, M. (2013). Framework for a Comparative Accelerated Testing Standard for PV Modules: Preprint. 8 pp.; NREL Report No. CP-5200-57838.


560 KB

19.  Kempe, M. D.; Miller, D. C.; Wohlgemuth, J.; Kurtz, S. R.; Moseley, J. M.; Shah, Q.; Tamizhmani, G.; Sakurai, K.; Inoue, M.; Doi, T.; Masuda, A.; Samuels, S. L.; Vanderpan, C. E. (2012). Field Evaluation of the Potential for Creep in Thermoplastic Encapsulant Materials: Preprint. 8 pp.; NREL Report No. CP-5200-54117.


3.5 MB

20.  Miller, D. C.; Muller, M.; Kempe, M. D.; Araki, K.; Kennedy, C. E.; Kurtz, S. R. (2012). Durability of Polymeric Encapsulation Materials for Concentrating Photovoltaic Systems (Presentation). NREL (National Renewable Energy Laboratory). 26 pp.; NREL Report No. PR-5200-54524.

21.  Kempe, M. D.; Miller, D. C.; Wohlgemuth, J. H.; Kurtz, S. R.; Moseley, J. M.; Shah, Q.; Tamizhmani, G.; Sakurai, K.; Inoue, M.; Doi, T.; Masuda, A.; Samuels, S. L.; Vanderpan, C. E. (2012). Evaluation of Creep in Thermoplastic Encapsulant Materials Deployed Outdoors. Photovoltaics International. Vol. 17, August 2012; pp. 128-138; NREL Report No. JA-5200-55965.


828 KB

22.  Hacke, P.; Smith, R.; Terwiliger, K.; Glick, S.; Jordan, D.; Johnston, S.; Kempe, M.; Kurtz, S. (2012). Testing and Analysis for Lifetime Prediction of Crystalline Silicon PV Modules Undergoing Degradation by System Voltage Stress: Preprint. 8 pp.; NREL Report No. CP-5200-54109.


1.2 MB

23.  Kempe, M.; Panchagade, D.; Dameron, A.; Reese, M. (2012). Predicting the Performance of Edge Seal Materials for PV (Presentation). NREL (National Renewable Energy Laboratory). 28 pp.; NREL Report No. PR-5200-54582.


234 KB

24.  Kempe, M. (2012). Optical Materials, Adhesive and Encapsulant, III-V, and Optical Characterization Evaluation: Cooperative Research and Development Final Report, CRADA Number CRD-07-216. 4 pp.; NREL Report No. TP-7A10-55834.

25.  Hacke, P.; Smith, R.; Terwiliger, K.; Glick, S.; Jordan, D.; Johnston, S.; Kempe, M.; Kurtz, S. (2012). Testing and Analysis for Lifetime Prediction of Crystalline Silicon PV Modules Undergoing Degradation by System Voltage Stress. [Proceedings] 38th IEEE Photovoltaic Specialists Conference (PVSC '12), 3-8 June 2012, Austin, Texas. Piscataway, NJ: Institute of Electrical and Electronics Engineers (IEEE) pp. 001750-001755; NREL Report No. CP-5200-56918. http://dx.doi.org/10.1109/PVSC.2012.6317933



List Next Documents

Help